SET and noise fault tolerant circuit design techniques: Application to 7 nm FinFET

نویسندگان

  • Antonio Calomarde
  • Esteve Amat
  • Francesc Moll
  • Julio Vigara
  • Antonio Rubio
چکیده

In the near future of high component density and low-power technologies, soft errors occurring not only in memory systems and latches but also in the combinational parts of logic circuits will seriously affect the reliable operation of integrated circuits. This paper presents a novel design style which reduces the impact of radiation-induced single event transients (SET) on logic circuits, and enhances the robustness in noisy environments. The independent design style of this method achieves SET mitigation and noise immunity by strengthening the sensitive nodes using a technique similar to feedback. A realization for this methodology is presented in 7 nm FinFET and in order to check the accuracy of our proposal, we compare it with others techniques for hardening radiation at the transistor level against a single event transient. Simulation results show that the proposed method has a good soft error tolerance capability as well as better noise immunity. 2013 Elsevier Ltd. All rights reserved.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Fault Tolerant Reversible QCA Design using TMR and Fault Detecting by a Comparator Circuit

Quantum-dot Cellular Automata (QCA) is an emerging and promising technology that provides significant improvements over CMOS. Recently QCA has been advocated as an applicant for implementing reversible circuits. However QCA, like other Nanotechnologies, suffers from a high fault rate. The main purpose of this paper is to develop a fault tolerant model of QCA circuits by redundancy in hardware a...

متن کامل

Fault Tolerant Reversible QCA Design using TMR and Fault Detecting by a Comparator Circuit

Quantum-dot Cellular Automata (QCA) is an emerging and promising technology that provides significant improvements over CMOS. Recently QCA has been advocated as an applicant for implementing reversible circuits. However QCA, like other Nanotechnologies, suffers from a high fault rate. The main purpose of this paper is to develop a fault tolerant model of QCA circuits by redundancy in hardware a...

متن کامل

Design of an Active Approach for Detection, Estimation and Short-Circuit Stator Fault Tolerant Control in Induction Motors

Three phase induction motors have many applications in industries. Consequently, detecting and estimating the fault and compensate it in a way that the faulty induction motor satisfies the predefined goals are important issues. One of the most common faults in induction motors is the short circuit of the stator winding. In this paper, an active fault-tolerant control system is designed and pres...

متن کامل

A Cross-Layer Framework for Designing and Optimizing Deeply-Scaled FinFET-Based Cache Memories

This paper presents a cross-layer framework in order to design and optimize energy-efficient cache memories made of deeply-scaled FinFET devices. The proposed design framework spans device, circuit and architecture levels and considers both superand near-threshold modes of operation. Initially, at the device-level, seven FinFET devices on a 7-nm process technology are designed in which only one...

متن کامل

Fault Tolerant DNA Computing Based on ‎Digital Microfluidic Biochips

   Historically, DNA molecules have been known as the building blocks of life, later on in 1994, Leonard Adelman introduced a technique to utilize DNA molecules for a new kind of computation. According to the massive parallelism, huge storage capacity and the ability of using the DNA molecules inside the living tissue, this type of computation is applied in many application areas such as me...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • Microelectronics Reliability

دوره 54  شماره 

صفحات  -

تاریخ انتشار 2014